Security Wire Weekly / April 19, 2006

This week News Editor Eric Parizo interviews Opus One Senior Partner and Information Security magazine Contributing Editor Joel Snyder on the complexities of product testing, plus all the top information security news and why data theft may not cause pain and suffering after all. Listen on your PC or download to your favorite mobile device.

http://media.techtarget.com/audioCast/SECURITY/SecurityWireWeekly_mp3_4-19-06.mp3